11 Einträge gefunden

1. Study of high-dose X-ray radiation damage of silicon sensors

   1. Klanner, Robert
   2. Fretwurst, E.
   3. Pintilie, I.
   4. Schwandt, Jörn
   5. Zhang, J.

   2013 - Forschungsinformationssystem der UHH
2. Radiation damage in n-type silicon diodes after electron irradiation with energies between 1.5 MeV and 15 MeV

   1. Radu, R.
   2. Fretwurst, E.
   3. Klanner, Robert
   4. Lindstroem, G.
   5. Pintilie, I.

   2013 - Forschungsinformationssystem der UHH
3. Challenges for silicon pixel sensors at the European XFEL

   1. Klanner, Robert
   2. Becker, J.
   3. Fretwurst, E.
   4. Pintilie, I.
   5. Pöhlsen, T.
   6. Schwandt, Jörn
   7. Zhang, J.

   2013 - Forschungsinformationssystem der UHH
4. Study of high-dose X-ray radiation damage of silicon sensors

   1. Schwandt, Jörn
   2. Fretwurst, E.
   3. Klanner, Robert
   4. Pintilie, I.
   5. Zhang, J.

   2013 - Forschungsinformationssystem der UHH
5. Optimization of the radiation hardness of silicon pixel sensors for high x-ray doses using TCAD simulations

   1. Schwandt, Jörn
   2. Fretwurst, E.
   3. Klanner, Robert
   4. Pintilie, I.
   5. Zhang, J.

   2012 - Forschungsinformationssystem der UHH
6. Investigation of X-ray induced radiation damage at the Si-SiO₂ interface of silicon sensors for the European XFEL

   1. Zhang, J.
   2. Fretwurst, E.
   3. Klanner, Robert
   4. Pintilie, I.
   5. Schwandt, Jörn
   6. Turcato, M.

   2012 - Forschungsinformationssystem der UHH - frei zugänglich
7. A contribution to the identification of the E5 defect level as tri-vacancy (V3)

   1. Junkes, Alexandra
   2. Pintilie, I.
   3. Fretwurst, E.
   4. Eckstein, D.

   2012 - Forschungsinformationssystem der UHH
8. Study of radiation damage induced by 12 keV X-rays in MOS structures built on high-resistivity n-type silicon

   1. Zhang, J.
   2. Pintilie, I.
   3. Fretwurst, E.
   4. Klanner, Robert
   5. Perrey, H.
   6. Schwandt, Jörn

   2012 - Forschungsinformationssystem der UHH
9. Study of X-ray radiation damage in silicon sensors

   1. Zhang, J.
   2. Fretwurst, E.
   3. Klanner, Robert
   4. Perrey, H.
   5. Pintilie, I.
   6. Poehlsen, T.
   7. Schwandt, Jörn

   2011 - Forschungsinformationssystem der UHH
10. Annealing study of a bistable cluster defect

    1. Junkes, Alexandra
    2. Eckstein, D.
    3. Pintilie, I.
    4. Makarenko, L.F.
    5. Fretwurst, E.

    2010 - Forschungsinformationssystem der UHH
11. Radiation-induced point- and cluster-related defects with strong impact on damage properties of silicon detectors

    1. Pintilie, I.
    2. Lindstroem, G.
    3. Junkes, Alexandra
    4. Fretwurst, E.

    2009 - Forschungsinformationssystem der UHH