Autor/in Kirz, J. Beetz, T. 1 Chapman, H. N. 1 Chapman, Henry 1 Cui, C. 1 Holton, J. M. 1 Howells, M. R. 1 Jacobsen, C. J. 1 Lima, E. 1 Marchesini, S. 1 Miao, H. 1 Sayre, D. 1 Stampanoni, M. 1 alle zeigenListe einklappen
X-ray Microscopy and Microtomography Chapman, Henry Kirz, J. Stampanoni, M. 2013 - Forschungsinformationssystem der UHH
An assessment of the resolution limitation due to radiation-damage in X-ray diffraction microscopy Howells, M. R. Beetz, T. Chapman, H. N. Cui, C. Holton, J. M. Jacobsen, C. J. Kirz, J. 2009 - Forschungsinformationssystem der UHH