Autor/in Rettig, Rasmus Stolz, Wolfgang Bernatz, Georg 1 Marschner, Thomas 1 Nau, Siegfried 1 Tapfer, Leander 1 alle zeigenListe einklappen
Effect of MOVPE growth interruptions on the gallium arsenide interior interface morphology Bernatz, Georg Nau, Siegfried Rettig, Rasmus Stolz, Wolfgang 2000 - ReposIt
X-ray diffraction study of intentionally disordered (GaIn)As/Ga(PAs) heterostructures Rettig, Rasmus Marschner, Thomas Stolz, Wolfgang Tapfer, Leander 1998 - ReposIt
Atomic scale properties of interior interfaces of semiconductor heterostructures as determined by quasi-digital highly selective etching and atomic force microscopy Rettig, Rasmus Stolz, Wolfgang 1998 - ReposIt