Electronic properties of etched-regrown heterostructure interfaces Beyer, S. Lohr, S. Heyn, Ch. Heitmann, D. Hansen, W. 2003 - Forschungsinformationssystem der UHH
Etching temperature dependent mobilities up to 190.000 cm2/Vs at chlorine etched and regrown interfaces Beyer, S. Lohr, S. Heyn, Ch. Heitmann, D. Hansen, W. 2002 - Forschungsinformationssystem der UHH