2 Einträge gefunden

1. Radiation damage in n-type silicon diodes after electron irradiation with energies between 1.5 MeV and 15 MeV

   1. Radu, R.
   2. Fretwurst, E.
   3. Klanner, Robert
   4. Lindstroem, G.
   5. Pintilie, I.

   2013 - Forschungsinformationssystem der UHH
2. Radiation-induced point- and cluster-related defects with strong impact on damage properties of silicon detectors

   1. Pintilie, I.
   2. Lindstroem, G.
   3. Junkes, Alexandra
   4. Fretwurst, E.

   2009 - Forschungsinformationssystem der UHH