Sub-micrometer focusing and high-resolution imaging with refractive lenses and multilayer laue optics Bajt, S. Schroer, Christian Gustav 2020 - Forschungsinformationssystem der UHH
A ray-trace analysis of x-ray multilayer Laue lenses for nanometer focusing Chapman, Henry Bajt, S. 2020 - Forschungsinformationssystem der UHH