Autor/in Boye, Pit 1 Feldkamp, Jan M. 1 Giewekemeyer, Klaus 1 Gulden, Johannes 1 Hoppe, Robert 1 Patommel, Jens 1 Salditt, Tim 1 Samberg, Dirk Schropp, Andreas 1 Stephan, Sandra 1 Wilke, Robin Niklas 1 alle zeigen Liste einklappen
Hard x-ray nanobeam characterization by coherent diffraction microscopy Schropp, Andreas Boye, Pit Feldkamp, Jan M. Hoppe, Robert Patommel, Jens Samberg, Dirk Stephan, Sandra 2010 - ReposIt
