X-ray diffraction study of intentionally disordered (GaIn)As/Ga(PAs) heterostructures Rettig, Rasmus Marschner, Thomas Stolz, Wolfgang Tapfer, Leander 1998 - ReposIt
Atomic scale properties of interior interfaces of semiconductor heterostructures as determined by quasi-digital highly selective etching and atomic force microscopy Rettig, Rasmus Stolz, Wolfgang 1998 - ReposIt