7 Einträge gefunden

1. High pressure x-ray diffraction studies on nanocrystalline materials

   1. Palosz, B
   2. Stel'makh, S
   3. Grzanka, E
   4. Gierlotka, S
   5. Pielaszek, R
   6. Bismayer, U
   7. Werner, S

   2004 - Forschungsinformationssystem der UHH
2. Application of X-ray powder diffraction to nano-materials - Determination of the atomic structure of nanocrystals with relaxed and strained surfaces

   1. Palosz, B
   2. Grzanka, E
   3. Gierlotka, S
   4. Stel'makh, S
   5. Pielaszek, R
   6. Lojkowski, W
   7. Bismayer, U

   2003 - Forschungsinformationssystem der UHH
3. Application of powder diffraction methods to the analysis of short- and long-range atomic order in nanocrystalline diamond and SiC: the concept of the apparent lattice parameter (alp)

   1. Palosz, B
   2. Grzanka, E
   3. Stel'makh, S
   4. Gierlotka, S
   5. Pielaszek, R
   6. Bismayer, U
   7. Weber, HP

   2003 - Forschungsinformationssystem der UHH
4. Generation and relaxation of microstrains in GaN nanocrystals under extreme pressures

   1. Grzanka, E
   2. Palosz, B
   3. Gierlotka, S
   4. Pielaszek, R
   5. Bismayer, U
   6. Janik, JF
   7. Wells, JR

   2002 - Forschungsinformationssystem der UHH - frei zugänglich
5. Diffraction studies of nanocrystals: Theory and experiment

   1. Palosz, B
   2. Grzanka, E
   3. Gierlotka, S
   4. Stel'Makh, S
   5. Pielaszek, R
   6. Bismayer, U
   7. Neuefeind, J

   2002 - Forschungsinformationssystem der UHH
6. Analysis of short and long range atomic order in nanocrystalline diamonds with application of powder diffractometry

   1. Palosz, B
   2. Grzanka, E
   3. Gierlotka, S
   4. Stel'makh, S
   5. Pielaszek, R
   6. Bismayer, U
   7. Neuefeind, J

   2002 - Forschungsinformationssystem der UHH
7. Distribution of strain in GaN and SiC nanocrystals under extreme pressures

   1. Palosz, B
   2. Gierlotka, S
   3. Grzanka, E
   4. Akimow, K
   5. Pielaszek, R
   6. Biczyk, P
   7. Grzegorczyk, A

   2001 - Forschungsinformationssystem der UHH