Dynamic scanning force microscopy at low temperatures on a van der Waals surface: Graphite (0001)

Link:
Autor/in:
Erscheinungsjahr:
1999
Medientyp:
Text
Schlagworte:
  • 07.20.Mc
  • 07.79.Sp
  • 61.16.Ch
  • 81.05.Tp
  • APN
  • GK
  • Graphite
  • HOPG
  • Low-temperature atomic force microscopy
  • Non-contact atomic force microscopy
  • Van der Waals
Beschreibung:
  • The (0001) surface of highly oriented pyrolytic graphite is studied by scanning force microscopy in both contact and dynamic mode. Low temperatures were necessary for the dynamic mode measurements in order to achieve the required signal to noise ratio. At 22 K, atomic scale structures with 2.46 Å periodicity and trigonal symmetry of the individual maxima were obtained in both modes. Since graphite exhibits a van der Waals surface in good approximation, this result shows that comparatively weak forces of van der Waals type are sufficient for successful imaging in the dynamic mode on the atomic scale. However, since the positions of the observed maxima correspond to the ones found by scanning tunneling microscopy and contact scanning force microscopy, but not to the positions of the carbon atoms, it also opens new questions on the imaging mechanism in the dynamic mode.
Lizenz:
  • info:eu-repo/semantics/closedAccess
Quellsystem:
Forschungsinformationssystem der UHH

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oai:www.edit.fis.uni-hamburg.de:publications/6a9a3301-a3d7-43f6-8540-8986536b3329