Focusing hard x rays beyond the critical angle of total reflection by adiabatically focusing lenses

Link:
Autor/in:
Erscheinungsjahr:
2017
Medientyp:
Text
Schlagworte:
  • Imaging techniques
  • Retrieval
  • Ptychographic microscopy
  • X Ray Optics
  • Phase Contrast
  • Synchrotron Radiation
  • Imaging techniques
  • Retrieval
  • Ptychographic microscopy
  • X Ray Optics
  • Phase Contrast
  • Synchrotron Radiation
Beschreibung:
  • In response to the conjecture that the numerical aperture of x-ray optics is fundamentally limited by the critical angle of total reflection {[}Bergemann et al., Phys. Rev. Lett. 91, 204801 (2003)], the concept of adiabatically focusing refractive lenses was proposed to overcome this limit {[}Schroer and Lengeler, Phys. Rev. Lett. 94, 054802 (2005)]. We present an experimental realization of these optics made of silicon and demonstrate that they indeed focus 20 keV x rays to a 18.4 nm focus with a numerical aperture of 1.73(9) x 10(-3) that clearly exceeds the critical angle of total reflection of 1.55 mrad. Published by AIP Publishing.
Lizenz:
  • info:eu-repo/semantics/restrictedAccess
Quellsystem:
Forschungsinformationssystem der UHH

Interne Metadaten
Quelldatensatz
oai:www.edit.fis.uni-hamburg.de:publications/2d207617-3445-4b2d-b55a-c3e2db5b2c5a