Determination of tip-sample interaction potentials by dynamic force spectroscopy

Link:
Autor/in:
Erscheinungsjahr:
1999
Medientyp:
Text
Schlagworte:
  • Atomic force microscopy
  • Tips
  • Noncontact atomic
  • Atomic Force Microscopy
  • Self Assembled Monolayers
  • Molecules
  • Atomic force microscopy
  • Tips
  • Noncontact atomic
  • Atomic Force Microscopy
  • Self Assembled Monolayers
  • Molecules
Beschreibung:
  • We introduce a new method which allows the precise determination of the tip-sample interaction potentials with an atomic force microscope and avoids the so-called “jump to contact” of the tip to the sample surface. The method is based on the measurement of the resonance frequency as a function of the resonance amplitude of the oscillated cantilever. The application of this method to model potentials and to experimental data, obtained for a graphite sample and a silicon tip in ultrahigh vacuum, demonstrates its reliability. © 1999 The American Physical Society.
Lizenz:
  • info:eu-repo/semantics/closedAccess
Quellsystem:
Forschungsinformationssystem der UHH
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Quelldatensatz
oai:www.edit.fis.uni-hamburg.de:publications/b44928b2-9a15-4c7f-a963-0a137977a4d7