Selected examples of the application of scanning probe methods for the fabrication, characterization, and testing of electronic and magnetic devices are presented. In particular, promising combinations of conventional photolithography or e-beam lithography with scanning probe methods are described. The combination of atomic-scale self-organization processes with scanning probe microscopy and manipulation experiments possibly can lead to a novel class of atomic-scale devices which could be fabricated on a reasonable time scale. (C) 1996 American Vacuum Society.