Simulation of high-intensity x-ray scattering from a crystal that is larger than the transverse x-ray beam profile is presented. We consider a crystal with a size of a micron, when irradiated by an x-ray beam having a focus of 100 nm. We discuss the methodological challenges that had to be overcome in order to calculate the x-ray scattering pattern. Our calculations enable us to identify the characteristic features of the spatial beam profile imprinted in the scattering pattern.