STM on Layered Materials

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Erscheinungsjahr:
1994
Medientyp:
Text
Beschreibung:
  • Layered materials [6.1] exhibit many properties which make them special with regards to STM studies and in scanning probe microscopy in general. Thus an entire chapter is devoted to STM investigations of layered materials, although, depending on the electrical conductivity of the layered materials, these investigations could also have been included in the chapters on metals or semiconductors. In contrast, insulating layered materials cannot be studied by STM but only by its relative, atomic force microscopy (AFM). Such investigations are reported in the chapter entitled “Scanning Force Microscopy” in the second volume on “Scanning Tunneling Microscopy”.
Lizenz:
  • info:eu-repo/semantics/closedAccess
Quellsystem:
Forschungsinformationssystem der UHH

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oai:www.edit.fis.uni-hamburg.de:publications/7f2dc3e1-6429-45d9-b4ff-d5235aae0eca