Epitaxial growth by pulsed laser deposition of Er-doped Sc2O3 films on sesquioxides monitored in situ by reflection high energy electron diffraction

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Erscheinungsjahr:
2007
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Text
Beschreibung:
  • In this letter, the authors report on the epitaxial growth by pulsed laser deposition of Sc2O3 and Er(5%):Sc2O3 films on {100} and {111} oriented Sc2O3. They observed layer-by-layer growth in the orientation defined by the substrate. This was indicated by reflection high energy electron diffraction as intensity oscillations of the specularly reflected electron beam. A monolayer-smooth film surface was observed by atomic force microscopy. Such a growth behavior was also achieved during initial growth of Sc2O3 on {100} oriented Y2O3. Additional x-ray diffraction analysis shows good agreement with the growth behavior mentioned above.
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  • info:eu-repo/semantics/closedAccess
Quellsystem:
Forschungsinformationssystem der UHH

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oai:www.edit.fis.uni-hamburg.de:publications/b24e6fd1-7c6f-4c58-b6c8-378b3943aa22