Towards phasing using high X-ray intensity

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Autor/in:
Erscheinungsjahr:
2015
Medientyp:
Text
Schlagworte:
  • X-ray free-electron lasers
  • electronic damage
  • high XFEL doses
  • high-intensity phasing
  • radiation damage
  • serial femtosecond crystallography
Beschreibung:
  • X-ray free-electron lasers (XFELs) show great promise for macromolecular structure determination from sub-micrometre-sized crystals, using the emerging method of serial femtosecond crystallography. The extreme brightness of the XFEL radiation can multiply ionize most, if not all, atoms in a protein, causing their scattering factors to change during the pulse, with a preferential `bleaching' of heavy atoms. This paper investigates the effects of electronic damage on experimental data collected from a Gd derivative of lysozyme microcrystals at different X-ray intensities, and the degree of ionization of Gd atoms is quantified from phased difference Fourier maps. A pattern sorting scheme is proposed to maximize the ionization contrast and the way in which the local electronic damage can be used for a new experimental phasing method is discussed.
Lizenz:
  • info:eu-repo/semantics/openAccess
Quellsystem:
Forschungsinformationssystem der UHH

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oai:www.edit.fis.uni-hamburg.de:publications/a7fe31f8-ad5c-44c9-8ad2-a90ab73d2ad4