In this work barium hexaferrite films for self-biased nonreciprocal devices are produced by means of the sol-gel method. The effect of the drying temperature on the film surface is examined via scanning electron microscopy. The influence of the crystallization temperature and the composition of the precursors on secondary phases is analyzed via X-ray diffraction analysis. Measurements of a coplanar waveguide with a barium hexaferrite thin-film show nonreciprocal behavior at the ferromagnetic resonant frequency in the Q-band without external biasing field.
