Characterizing the focus of a multilayer coated off-axis parabola for FLASH beam at λ = 4.3 nm

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Autor/in:
Erscheinungsjahr:
2013
Medientyp:
Text
Schlagworte:
  • Cr/Sc multilayer
  • Free-electron laser
  • ablative piston effect
  • beam imprint
  • laser ablation
  • radiation damage
  • water window
  • x-ray optic
Beschreibung:
  • A super-polished substrate with an off-axis parabola figure was coated with a Sc/B4C/Cr multilayer. This optic was used to focus pulses of 4.3 nm photons from the Free-electron LASer in Hamburg (FLASH) at normal incidence. Beam imprints were made in poly(methyl methacrylate) to align the optic and to measure the beam profile at the focal plane. The intense interaction resulted in imprints with raised perimeters, surrounded by ablated material extending out several micrometres. These features interfere with the beam profile measurement. The effect of a post-exposure development step on the beam imprints was investigated. © 2013 SPIE.
Lizenz:
  • info:eu-repo/semantics/restrictedAccess
Quellsystem:
Forschungsinformationssystem der UHH
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oai:www.edit.fis.uni-hamburg.de:publications/1bf77003-915e-4d2b-9b0b-28ab5a7aa07d