A provisional setup for X-ray microprobe experiments at 35 keV is described. It is based on compoundrefractive lenses (CRLs) for nanofocusing and a Vortex silicon drift detector with 2 mm sensorthickness for increased sensitivity at high energies. The Microprobe experiment (PETRA III) generallyuses Kirkpatrick-Baez mirrors for submicrometer focusing in the energy range of 5–21 keV.However, various types of scanning X-ray microscopy experiments require higher excitation energies.The CRL optics were characterized by X-ray ptychography and X-ray fluorescence (XRF) knife edgescans on a siemens star pattern and showed beam sizes down to 110 nm. The performance of the newsetup for microscopic X-ray diffraction (XRD)–XRF scanning X-ray microscopy measurements at35 keV is demonstrated on a cross-section of a painting fragment.