Magnetic Force Microscopy of Ni Nanoparticles Formed by Coalescence Method

Link:
Autor/in:
Erscheinungsjahr:
1998
Medientyp:
Text
Schlagworte:
  • Electron microscopes
  • Scanning
  • Scanning electron microscopy
  • Focused Ion Beams
  • Electron Beams
  • Field Emission
  • Electron microscopes
  • Scanning
  • Scanning electron microscopy
  • Focused Ion Beams
  • Electron Beams
  • Field Emission
Lizenz:
  • info:eu-repo/semantics/restrictedAccess
Quellsystem:
Forschungsinformationssystem der UHH
Interne Metadaten
Quelldatensatz
oai:www.edit.fis.uni-hamburg.de:publications/e32702a2-ec01-456c-8816-2f1d82c2bfbf