X-Ray Fluorescence and Reflectography Data from Paris, Bibliothèque Nationale de France, Ms LAT10757 and Ms NAL763

Link:
Autor/in:
Beteiligte Personen:
  • Bonnerot, Olivier
  • Shevchuk, Ivan
  • Rabin, Ira
  • Hennings, Till
  • Depreux, Philippe
Verlag/Körperschaft:
Universität Hamburg
Erscheinungsjahr:
2020
Medientyp:
Datensatz
Schlagworte:
  • CSMC
  • SFB950
  • Manuscript
  • Written Artefacts
  • Artefact Profiling
  • BAM
  • Bibliothèque Nationale de France
  • Z02
  • C08
  • X-Ray Fluorescence (XRF)
  • UV-VIS-NIR Reflectography
  • Bruker XGLab ELIO
  • DinoLite USB Microscope
  • Parchment
  • Iron Gall Ink
  • Vermillion
  • Ink Analysis
  • 9th century CE
  • 10th century CE
  • Latin
  • Lotharingia
Beschreibung:

  • XRF (Elio: 40kV, 20 µA, spot measurements of 60s each), and reflectography (DinoLite: x50 magnification, vis, NIR and UV light) analysis of inks from BNF Ms LAT10757(10th century CE) and Ms NAL763 (9th century CE) from the Bibliothèque nationale de France (France).

    Analysis of 14 folios (32 spots on ink + 14 spots on parchment) from Ms LAT10757; 29 folios (92 spots on ink + 29 spots on paper) from Ms NAL763

    1. LAT10757.pptx - protocol and results for BNF Ms LAT10757
    2. LAT10757.xlsx - complete XRF results for BNF Ms LAT10757
    3. NAL763.pptx - protocol and results for BNF Ms NAL763
    4. NAL763.xlsx - complete XRF results for BNF Ms NAL763
    5. Reflectography_LAT10757.zip - complete reflectography Dataset for BNF Ms LAT10757
    6. Reflectography_NAL763.zip - complete reflectography Dataset for BNF Ms NAL763
    7. XRF_LAT10757.zip - complete XRF Dataset for BNF Ms LAT10757
    8. XRF_NAL763.zip - complete XRF Dataset for BNF Ms NAL763
  • The research for project C08 was funded by the Deutsche Forschungsgemeinschaft (DFG, German Research Foundation) within the Sonderforschungsbereich 950 (SFB 950). The research was conducted within the scope of the Centre for the Study of Manuscript Cultures (CSMC) at Universität Hamburg in collaboration with the Bundesanstalt für Materialforschung und -prüfung (BAM).
Beziehungen:
DOI 10.25592/uhhfdm.1584
Lizenz:
  • info:eu-repo/semantics/restrictedAccess
Quellsystem:
Forschungsdatenrepositorium der UHH
Interne Metadaten
Quelldatensatz
oai:fdr.uni-hamburg.de:1585