Load-dependent topographic and friction studies of individual ion tracks in layered materials by scanning force microscopy and lateral force microscopy

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Autor/in:
Erscheinungsjahr:
1996
Medientyp:
Text
Schlagworte:
  • Heavy ions
  • Ion bombardment
  • Track formation
  • Secondary Ion Mass Spectrometry
  • Ion Beams
  • Ion Bombardment
  • Heavy ions
  • Ion bombardment
  • Track formation
  • Secondary Ion Mass Spectrometry
  • Ion Beams
  • Ion Bombardment
Beschreibung:
  • We have studied individual latent tracks induced by 500-MeV Xe ions in muscovite mica by scanning force microscopy (SFM) and lateral force microscopy (LFM) as a function of the applied loading force (Formula presented). It was found that the observed contrast as well as the apparent diameter of the latent ion tracks as imaged by SFM and LFM depends critically on (Formula presented). Good agreement with small-angle x-ray-diffraction data is obtained only in the limit of zero applied load. © 1996 The American Physical Society.
Lizenz:
  • info:eu-repo/semantics/closedAccess
Quellsystem:
Forschungsinformationssystem der UHH
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Quelldatensatz
oai:www.edit.fis.uni-hamburg.de:publications/3ce4eeaa-8e48-40ca-a994-d309fb6c1527