Structure of cross-tie wall in thin Co films resolved by magnetic force microscopy

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Autor/in:
Erscheinungsjahr:
1996
Medientyp:
Text
Schlagworte:
  • Domain walls
  • Magnetization
  • In-plane anisotropy
  • Magnetic Anisotropy
  • Magnetism
  • Domain walls
  • Magnetization
  • In-plane anisotropy
  • Magnetic Anisotropy
  • Magnetism
Beschreibung:
  • We have studied the magnetic domain structure of a thin polycrystalline Co film by magnetic force microscopy (MFM). Domain walls of the cross-tie type have been observed for a Co film of 50 nm thickness. Due to the high lateral resolution of MFM we have been able to study the magnetic structure of a single cross tie. We have determined locations of Bloch lines within a domain wall comparing the experimental data with a theoretical model of a cross-tie wall. In order to explain our experimental results we have proposed a model for the interaction between a MFM tip and a cross-tie wall. © 1996 American Institute of Physics.
Lizenz:
  • info:eu-repo/semantics/closedAccess
Quellsystem:
Forschungsinformationssystem der UHH
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Quelldatensatz
oai:www.edit.fis.uni-hamburg.de:publications/91976a91-b469-46c8-a3a3-57f8800cc9f7