Spatial characterization of the focus produced by an EUV Schwarzschild objective

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Autor/in:
Erscheinungsjahr:
2014
Medientyp:
Text
Schlagworte:
  • X ray microscopes
  • Microscopy
  • X-ray microscopy
  • X Ray Optics
  • Phase Contrast
  • Synchrotron Radiation
  • X ray microscopes
  • Microscopy
  • X-ray microscopy
  • X Ray Optics
  • Phase Contrast
  • Synchrotron Radiation
Beschreibung:
  • Schwarzschild objectives are used in the EUV spectral range because of their large aperture, high mechanical stability and excellent achromaticity. The large aperture results in a small, theoretically diffraction limited focus diameter with ideal values of below 200 nm with the current configuration. We employed a zone plate with matched numerical aperture (0.19) to image the focus onto an X-ray CCD camera. Emission from high harmonic generation and a liquid-jet laser-plasma were used as light sources. Images at magnifications of about 150-fold were acquired and focus diameters of 300 nm (FWHM) were observed.
Lizenz:
  • info:eu-repo/semantics/restrictedAccess
Quellsystem:
Forschungsinformationssystem der UHH

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oai:www.edit.fis.uni-hamburg.de:publications/6b059f9a-7aad-4c70-b176-fcfb4d0722a5