Preparation of probe tips with well-defined spherical apexes for quantitative scanning force spectroscopy

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Autor/in:
Erscheinungsjahr:
1997
Medientyp:
Text
Schlagworte:
  • Tribology
  • Friction
  • Sliding friction
  • Atomic Force Microscopy
  • Self Assembled Monolayers
  • Molecules
  • Tribology
  • Friction
  • Sliding friction
  • Atomic Force Microscopy
  • Self Assembled Monolayers
  • Molecules
Beschreibung:
  • A method for the preparation of scanning force microscopy (SFM) tips with spherically shaped tip apexes and known tip radii by exposing commercially available silicon cantilevers to the electron beam of a transmission electron microscope is presented. The spherical shape of the tip apexes was achieved by growth of a contamination layer at the end of the tip using the electron-beam deposition process. Well-defined radii between 7 and 120 nm could be produced. The importance of such tips for quantitative SFM measurements is discussed. Topographical measurements on a special test sample are shown as well as measurements of the frictional force as a function of the loading force as an example for quantitative spectroscopical measurements. © 1997 American Vacuum Society.
Lizenz:
  • info:eu-repo/semantics/closedAccess
Quellsystem:
Forschungsinformationssystem der UHH
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Quelldatensatz
oai:www.edit.fis.uni-hamburg.de:publications/dfcdbe97-8e61-4b6f-b0c5-6fba3d2ff08e