Ptychography with multilayer laue lenses

Link:
Autor/in:
Erscheinungsjahr:
2014
Medientyp:
Text
Schlagworte:
  • X ray microscopes
  • Microscopy
  • X-ray microscopy
  • X Ray Optics
  • Phase Contrast
  • Synchrotron Radiation
  • X ray microscopes
  • Microscopy
  • X-ray microscopy
  • X Ray Optics
  • Phase Contrast
  • Synchrotron Radiation
Beschreibung:
  • Two different multilayer Laue lens designs were made with total deposition thicknesses of 48 mu m and 53 mu m, and focal lengths of 20.0 mm and 12.5 mm at 20.0 keV, respectively. From these two multilayer systems, several lenses were manufactured for one-and two-dimensional focusing. The latter is realised with a directly bonded assembly of two crossed lenses, that reduces the distance between the lenses in the beam direction to 30 mm and eliminates the necessity of producing different multilayer systems. Characterization of lens fabrication was performed using a laboratory X-ray microscope. Focusing properties have been investigated using ptychography.
Lizenz:
  • info:eu-repo/semantics/restrictedAccess
Quellsystem:
Forschungsinformationssystem der UHH

Interne Metadaten
Quelldatensatz
oai:www.edit.fis.uni-hamburg.de:publications/aa1ccf50-7e26-4502-b345-c5f419a859d6