Dynamic scanning force microscopy at low temperatures

Link:

https://doi.org/10.1143/jjap.39.3701

Autor/in:

Erscheinungsjahr:

2000

Medientyp:

Text

Schlagworte:

HOPG
graphite
low-temperature atomic force microscopy
non-contact atomic force microscopy
van der Waals

Beschreibung:

In this paper, we review the design and various applications of a low temperature scanning force microscope for ultrahigh vacuum. It has been adopted for dynamic mode measurements, a powerful method to image surfaces with a resolution similar to scanning tunneling microscopy, but without the limitation to conducting materials. With this instrument, we have studied semiconducting (InAs), conducting (HOPG) and insulating samples (xenon thin film). Finally, we discuss a new experimental method to determine the tip-sample interaction with high accuracy. ©2000 The Japan Society of Applied Physics.

Lizenz:

info:eu-repo/semantics/closedAccess

Quellsystem:

Forschungsinformationssystem der UHH

Interne Metadaten

Quelldatensatz: oai:www.edit.fis.uni-hamburg.de:publications/6c1da75d-cb80-4c2b-9e66-a9a64b88abe9