6 Einträge gefunden

1. Upscaling of multi-beam x-ray ptychography for efficient x-ray microscopy with high resolution and large field of view

   1. Wittwer, F.
   2. Lyubomirskiy, M.
   3. Koch, F.
   4. Kahnt, M.
   5. Seyrich, M.
   6. Garrevoet, J.
   7. David, C.

   2021 - Forschungsinformationssystem der UHH
2. Planar refractive lenses made of SiC for high intensity nanofocusing

   1. Lyubomirskiy, M.
   2. Schurink, B.
   3. Makhotkin, I.A.
   4. Brueckner, D.
   5. Wittwer, F.
   6. Kahnt, M.
   7. Seyrich, M.

   2021 - Forschungsinformationssystem der UHH
3. PtyNAMi: Ptychographic nano-analytical microscope at PETRA III - Interferometrically tracking positions for 3D x-ray scanning microscopy using a ball-lens retroreflector

   1. Schroer, Christian Gustav
   2. Seyrich, M.
   3. Kahnt, M.
   4. Botta, S.
   5. Döhrmann, R.
   6. Falkenberg, G.
   7. Garrevoet, J.

   2017 - Forschungsinformationssystem der UHH
4. Structure and Composition of Isolated Core-Shell (In,Ga) N/GaN Rods Based on Nanofocus X-Ray Diffraction and Scanning Transmission Electron Microscopy

   1. Krause, T.
   2. Hanke, M.
   3. Nicolai, L.
   4. Cheng, Z.
   5. Niehle, M.
   6. Trampert, A.
   7. Kahnt, M.

   2017 - Forschungsinformationssystem der UHH
5. Hard x-ray nanoprobe of beamline P06 at PETRA III

   1. Schroer, Christian Gustav
   2. Baumbach, C.
   3. Döhrmann, R.
   4. Klare, S.
   5. Hoppe, R.
   6. Kahnt, M.
   7. Patommel, J.

   2016 - Forschungsinformationssystem der UHH
6. Quantitative characterization of aberrations in x-ray optics

   1. Seiboth, F.
   2. Kahnt, M.
   3. Scholz, M.
   4. Seyrich, M.
   5. Wittwer, F.
   6. Garrevoet, J.
   7. Falkenberg, G.

   2016 - Forschungsinformationssystem der UHH