3 Einträge gefunden

1. Investigation on the homogeneity of pulsed electrochemically deposited thermoelectric films with synchrotron -XRF, -XRD and -XANES

   1. Reinsberg, Klaus-Georg
   2. Schumacher, Christian
   3. Zastrow, Sebastian
   4. Nielsch, Kornelius
   5. Broekaert, José Alfons Clement
   6. Fittschen, Ursula Elisabeth Adriane

   2013 - Forschungsinformationssystem der UHH
2. Depth-profile analysis of thermoelectric layers on Si wafers by pulsed r.f. glow discharge time-of-flight mass spectrometry

   1. Reinsberg, Klaus-Georg
   2. Schumacher, Christian
   3. Tempez, Agnès
   4. Nielsch, Kornelius
   5. Broekaert, José Alfons Clement

   2012 - Forschungsinformationssystem der UHH
3. Precision improvements by the use of principal component regression and pooled regression applied to main component determinations with ICP-OES for thermoelectric films

   1. Reinsberg, Klaus-Georg
   2. Schumacher, Christian
   3. Nielsch, Kornelius
   4. Broekaert, José Alfons Clement

   2011 - Forschungsinformationssystem der UHH