Autor/in Bismayer, U 2 Gierlotka, S 2 Grzanka, E 2 Palosz, B 2 Palosz, W Pielaszek, R 2 Stel'makh, S 2 Weber, HP 2 Lojkowski, W 1 Neuefeind, J 1 Proffen, T 1 alle zeigenListe einklappen
Application of X-ray powder diffraction to nano-materials - Determination of the atomic structure of nanocrystals with relaxed and strained surfaces Palosz, B Grzanka, E Gierlotka, S Stel'makh, S Pielaszek, R Lojkowski, W Bismayer, U 2003 - Forschungsinformationssystem der UHH
Application of powder diffraction methods to the analysis of short- and long-range atomic order in nanocrystalline diamond and SiC: the concept of the apparent lattice parameter (alp) Palosz, B Grzanka, E Stel'makh, S Gierlotka, S Pielaszek, R Bismayer, U Weber, HP 2003 - Forschungsinformationssystem der UHH