Autor/in Ritter, Martin Bakucz, Peter 1 Buchholz, Ivesa 1 Buttgenbach, Stephanus 1 Clegg, W. J. 1 Fleischer, Jürgen 1 Jiao, Chengge 1 Korte, S. 1 Krah, Thomas 1 Kranzmann, Axel 1 Krüger-Sehm, Rolf 1 Midgley, P. A. 1 Viering, Benjamin 1 Weckenmann, Albert 1 Wiedenhöfer, Thomas 1 alle zeigenListe einklappen
Three-dimensional electron backscattered diffraction analysis of deformation in MgO micropillars Korte, S. Ritter, Martin Jiao, Chengge Midgley, P. A. Clegg, W. J. 2011 - TUHH Open Research
Trends in development of standards for micro-and nanometrology: Chances and challenges Weckenmann, Albert Wiedenhöfer, Thomas Buttgenbach, Stephanus Krah, Thomas Fleischer, Jürgen Buchholz, Ivesa Viering, Benjamin 2008 - TUHH Open Research