Autor/in Böttcher, Mathias 1 Dahl, David 1 Duan, Xiaomin 1 Lang, Klaus-Dieter 1 Ndip, Ivan N. Schuster, Christian Tschoban, Christian alle zeigenListe einklappen
High Frequency Characterization of Silicon Substrate and through Silicon Vias Duan, Xiaomin Böttcher, Mathias Dahl, David Schuster, Christian Tschoban, Christian Ndip, Ivan N. Lang, Klaus-Dieter 2016 - TUHH Open Research
