Autor/in Drüe, Karl-Heinz 3 Hein, Matthias Müller, Jens Perrone, Rubén Ariel Pohlner, Jürgen 3 Reppe, Günter 3 Schwanke, Dieter 3 Stephan, Ralf Kulke, Reinhard 2 Trabert, Johannes 2 Uhlig, Peter 2 Kutscher, C. 1 Thust, Heiko 1 Trabert, Johannes F. 1 alle zeigenListe einklappen
Comparison of high-resolution patterning technologies for LTCC microwave circuits Müller, Jens Perrone, Rubén Ariel Drüe, Karl-Heinz Stephan, Ralf Trabert, Johannes F. Hein, Matthias Schwanke, Dieter 2007 - TUHH Open Research
Comparison of high resolution patterning technologies for LTCC microwave circuits Müller, Jens Perrone, Rubén Ariel Drüe, Karl-Heinz Stephan, Ralf Trabert, Johannes Hein, Matthias Schwanke, Dieter 2007 - TUHH Open Research
Technology benchmarking of high resolution structures on LTCC for microwave circuits Müller, Jens Perrone, Rubén Ariel Thust, Heiko Drüe, Karl-Heinz Kutscher, C. Stephan, Ralf Trabert, Johannes 2006 - TUHH Open Research
