Autor/in Broekaert, José Alfons Clement 2 Nielsch, Kornelius Schumacher, Christian Akinsinde, Lewis 1 Bachmann, Julien 1 Detavernier, Christophe 1 Heiderich, Sonja 1 Rampelberg, Geert 1 Reinsberg, Klaus G. 1 Reinsberg, Klaus-Georg 1 Tempez, Agnès 1 Töllner, William 1 Zastrow, Sebastian 1 alle zeigenListe einklappen
Depth-profile analysis of thermoelectric layers on Si wafers by pulsed r.f. glow discharge time-of-flight mass spectrometry Reinsberg, Klaus-Georg Schumacher, Christian Tempez, Agnès Nielsch, Kornelius Broekaert, José Alfons Clement 2012 - Forschungsinformationssystem der UHH
Optimization of electrodeposited p-doped Sb2Te3 thermoelectric films by millisecond potentiostatic pulses Schumacher, Christian Reinsberg, Klaus G. Akinsinde, Lewis Zastrow, Sebastian Heiderich, Sonja Töllner, William Rampelberg, Geert 2012 - Forschungsinformationssystem der UHH