Autor/in Drüe, Karl-Heinz 2 Hein, Matthias 2 Müller, Jens 2 Perrone, Rubén Ariel 2 Pohlner, Jürgen 2 Reppe, Günter Schwanke, Dieter Stephan, Ralf Trabert, Johannes Kulke, Reinhard 1 Kutscher, C. 1 Thust, Heiko 1 Uhlig, Peter 1 alle zeigenListe einklappen
Comparison of high resolution patterning technologies for LTCC microwave circuits Müller, Jens Perrone, Rubén Ariel Drüe, Karl-Heinz Stephan, Ralf Trabert, Johannes Hein, Matthias Schwanke, Dieter 2007 - TUHH Open Research
Technology benchmarking of high resolution structures on LTCC for microwave circuits Müller, Jens Perrone, Rubén Ariel Thust, Heiko Drüe, Karl-Heinz Kutscher, C. Stephan, Ralf Trabert, Johannes 2006 - TUHH Open Research
