Scanning capacitancemicroscope as a tool for the characterization of integrated circuits Born, A. Wiesendanger, R. 1998 - Forschungsinformationssystem der UHH
Analysis of electrical breakdown failures bymeans of SFM-basedmethods Born, A. Olbrich, A. Maywald, M. Wiesendanger, Roland 1998 - Forschungsinformationssystem der UHH