2 Einträge gefunden

1. An Accurate Free Space Method for Material Characterization in W- Band Using Material Samples with Two Different Thicknesses

   1. Lau, Isabella
   2. Frank, Martin
   3. Shi, Kilin
   4. Lurz, Fabian
   5. Talai, Armin
   6. Weigel, Robert
   7. Kölpin, Alexander

   2018 - TUHH Open Research
2. A Resonant Substrate Integrated Waveguide Measurement System for True Relative Permittivity Extraction of PCB Materials up to 90 GHz

   1. Lau, Isabella
   2. Michler, Fabian
   3. Talai, Armin
   4. Weigel, Robert
   5. Kölpin, Alexander

   2018 - TUHH Open Research