8 Einträge gefunden

1. Multi-beam X-ray ptychography using coded probes for rapid non-destructive high resolution imaging of extended samples

   1. Lyubomirskiy, M.
   2. Wittwer, F.
   3. Kahnt, M.
   4. Koch, F.
   5. Kubec, A.
   6. Falch, K.V.
   7. Garrevoet, J.

   2022 - Forschungsinformationssystem der UHH - frei zugänglich
2. Imaging Cu₂O nanocube hollowing in solution by quantitative in situ X-ray ptychography

   1. Grote, L.
   2. Seyrich, M.
   3. Döhrmann, Ralph
   4. Harouna-Mayer, S.Y.
   5. Mancini, F.
   6. Kaziukenas, E.
   7. Fernandez-Cuesta, I.

   2022 - Forschungsinformationssystem der UHH - frei zugänglich
3. Four-fold multi-modal x-ray microscopy measurements of a cu(In,ga)se2 solar cell

   1. Ossig, C.
   2. Strelow, Christian
   3. Flügge, J.
   4. Kolditz, A.
   5. Siebels, J.
   6. Garrevoet, J.
   7. Spiers, K.

   2021 - Forschungsinformationssystem der UHH
4. Planar refractive lenses made of SiC for high intensity nanofocusing

   1. Lyubomirskiy, M.
   2. Schurink, B.
   3. Makhotkin, I.A.
   4. Brueckner, D.
   5. Wittwer, F.
   6. Kahnt, M.
   7. Seyrich, M.

   2021 - Forschungsinformationssystem der UHH
5. Upscaling of multi-beam x-ray ptychography for efficient x-ray microscopy with high resolution and large field of view

   1. Wittwer, F.
   2. Lyubomirskiy, M.
   3. Koch, F.
   4. Kahnt, M.
   5. Seyrich, M.
   6. Garrevoet, J.
   7. David, C.

   2021 - Forschungsinformationssystem der UHH
6. PtyNAMi: Ptychographic nano-analytical microscope

   1. Schropp, A.
   2. Dohrmann, R.
   3. Botta, S.
   4. Bruckner, D.
   5. Kahnt, M.
   6. Lyubomirskiy, M.
   7. Ossig, C.

   2020 - Forschungsinformationssystem der UHH
7. PtyNAMi: Ptychographic nano-analytical microscope at PETRA III - Interferometrically tracking positions for 3D x-ray scanning microscopy using a ball-lens retroreflector

   1. Schroer, Christian Gustav
   2. Seyrich, M.
   3. Kahnt, M.
   4. Botta, S.
   5. Döhrmann, R.
   6. Falkenberg, G.
   7. Garrevoet, J.

   2017 - Forschungsinformationssystem der UHH
8. Quantitative characterization of aberrations in x-ray optics

   1. Seiboth, F.
   2. Kahnt, M.
   3. Scholz, M.
   4. Seyrich, M.
   5. Wittwer, F.
   6. Garrevoet, J.
   7. Falkenberg, G.

   2016 - Forschungsinformationssystem der UHH