Silicon Pixel Sensors in the Inner Tracking System of the CMS Experiment Feindt, Finn 2021 - E-Dissertationen der UHH - frei zugänglich
Influence of radiation damage on the absorption of near-infrared light in silicon Scharf, Christian Feindt, Finn Klanner, Robert 2020 - Forschungsinformationssystem der UHH
Edge-TCT for the investigation of radiation damaged silicon strip sensors Feindt, Finn 2016 - Forschungsinformationssystem der UHH