Autor/in Böttcher, Mathias 1 Dahl, David Duan, Xiaomin Lang, Klaus-Dieter 1 Ndip, Ivan N. 1 Schuster, Christian 1 Tschoban, Christian alle zeigenListe einklappen
High Frequency Characterization of Silicon Substrate and through Silicon Vias Duan, Xiaomin Böttcher, Mathias Dahl, David Schuster, Christian Tschoban, Christian Ndip, Ivan N. Lang, Klaus-Dieter 2016 - TUHH Open Research
