2 Einträge gefunden

1. Application of the transverse resonance method for efficient extraction of the dispersion relation of arbitrary layers in silicon interposers

   1. Dahl, David
   2. Duan, Xiaomin
   3. Beyreuther, Anne
   4. Ndip, Ivan N.
   5. Lang, Klaus-Dieter
   6. Schuster, Christian

   2013 - TUHH Open Research
2. Applying a physics-based via model for the simulation of Through Silicon Vias

   1. Dahl, David
   2. Duan, Xiaomin
   3. Beyreuther, Anne
   4. Ndip, Ivan N.
   5. Lang, Klaus-Dieter
   6. Schuster, Christian

   2013 - TUHH Open Research