Autor/in Böttcher, Mathias Dahl, David 2 Duan, Xiaomin 2 Lang, Klaus-Dieter 2 Ndip, Ivan N. 2 Schuster, Christian Dobritz, Stephan 1 Tschoban, Christian 1 alle zeigenListe einklappen
High Frequency Characterization of Silicon Substrate and through Silicon Vias Duan, Xiaomin Böttcher, Mathias Dahl, David Schuster, Christian Tschoban, Christian Ndip, Ivan N. Lang, Klaus-Dieter 2016 - TUHH Open Research
Comparison of passivation materials for high frequency 3D packaging application up to 110 GHz Duan, Xiaomin Böttcher, Mathias Dobritz, Stephan Dahl, David Schuster, Christian Ndip, Ivan N. Lang, Klaus-Dieter 2016 - TUHH Open Research