Autor/in Duan, Xiaomin Brüns, Heinz-Dietrich 2 Gu, Xiaoxiong 2 Rimolo-Donadio, Renato 2 Schuster, Christian 2 Cho, Jonghyun 1 Han, Ki Jin 1 Kim, Joungho 1 Kwark, Young Hoon 1 Müller, Sebastian 1 Müller, Stefan 1 alle zeigenListe einklappen
Impact of multiple scattering on passivity of equivalent-circuit via models Duan, Xiaomin Rimolo-Donadio, Renato Müller, Sebastian Han, Ki Jin Gu, Xiaoxiong Kwark, Young Hoon Brüns, Heinz-Dietrich 2011 - TUHH Open Research
A through-silicon-via to active device noise coupling study for CMOS SOI technology Duan, Xiaomin Gu, Xiaoxiong Cho, Jonghyun Kim, Joungho 2011 - TUHH Open Research
Recent developments of via and return current path modeling Müller, Stefan Duan, Xiaomin Rimolo-Donadio, Renato Brüns, Heinz-Dietrich Schuster, Christian 2011 - TUHH Open Research