3 Einträge gefunden

1. Application of X-ray powder diffraction to nano-materials - Determination of the atomic structure of nanocrystals with relaxed and strained surfaces

   1. Palosz, B
   2. Grzanka, E
   3. Gierlotka, S
   4. Stel'makh, S
   5. Pielaszek, R
   6. Lojkowski, W
   7. Bismayer, U

   2003 - Forschungsinformationssystem der UHH
2. Application of powder diffraction methods to the analysis of short- and long-range atomic order in nanocrystalline diamond and SiC: the concept of the apparent lattice parameter (alp)

   1. Palosz, B
   2. Grzanka, E
   3. Stel'makh, S
   4. Gierlotka, S
   5. Pielaszek, R
   6. Bismayer, U
   7. Weber, HP

   2003 - Forschungsinformationssystem der UHH
3. Analysis of short and long range atomic order in nanocrystalline diamonds with application of powder diffractometry

   1. Palosz, B
   2. Grzanka, E
   3. Gierlotka, S
   4. Stel'makh, S
   5. Pielaszek, R
   6. Bismayer, U
   7. Neuefeind, J

   2002 - Forschungsinformationssystem der UHH