4 Einträge gefunden

1. Influence of radiation damage on the absorption of near-infrared light in silicon

   1. Scharf, Christian
   2. Feindt, Finn
   3. Klanner, Robert

   2020 - Forschungsinformationssystem der UHH
2. Precision measurement of the carrier drift velocities in 100 silicon

   1. Scharf, Christian
   2. Klanner, Robert

   2015 - Forschungsinformationssystem der UHH
3. Determination of the electronics transfer function for current transient measurements

   1. Scharf, Christian
   2. Klanner, Robert

   2015 - Forschungsinformationssystem der UHH
4. Measurement of the drift velocities of electrons and holes in high-ohmic (100) silicon

   1. Scharf, Christian
   2. Klanner, Robert

   2015 - Forschungsinformationssystem der UHH