Autor/in Bismayer, U Gierlotka, S 1 Grzanka, E 1 Lojkowski, W 1 Neuefeind, J Palosz, B 1 Palosz, W 1 Pielaszek, R 1 Stel'makh, S 1 Weber, HP 1 alle zeigenListe einklappen
Application of X-ray powder diffraction to nano-materials - Determination of the atomic structure of nanocrystals with relaxed and strained surfaces Palosz, B Grzanka, E Gierlotka, S Stel'makh, S Pielaszek, R Lojkowski, W Bismayer, U 2003 - Forschungsinformationssystem der UHH
