Radiation-tolerant all-digital PLL/CDR with varactorless LC DCO in 65 nm CMOS

Link:
Autor/in:
Verlag/Körperschaft:
Hamburg University of Technology
Erscheinungsjahr:
2021
Medientyp:
Text
Schlagworte:
  • All-Digital
  • PLL
  • CDR
  • Single-Event Effects
  • radiation hardening
  • 600: Technik
  • 620: Ingenieurwissenschaften
Beschreibung:
  • This paper presents the first fully integrated radiation-tolerant All-Digital Phase-Locked Loop (PLL) and Clock and Data Recovery (CDR) circuit for wireline communication applications. Several radiation hardening techniques are proposed to achieve state-of-the-art immunity to Single-Event Effects (SEEs) up to 62.52/mg as well as tolerance to the Total Ionizing Dose (TID) exceeding 1.5Grad. The LC Digitally Controlled Oscillator (DCO) is implemented without MOS varactors, avoiding the use of a highly SEE sensitive circuit element. The circuit is designed to operate at reference clock frequencies from 40–320 or at data rates from 40Mbps–320Mbps and displays a jitter performance of 520 with a power dissipation of only 11 and an FOM of 235 .
Beziehungen:
DOI 10.3390/electronics10222741
Lizenzen:
  • info:eu-repo/semantics/openAccess
  • https://creativecommons.org/licenses/by/4.0/
Quellsystem:
TUHH Open Research

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oai:tore.tuhh.de:11420/10961