6 Einträge gefunden

1. Embedded cavity based dielectric loss measurements for LTCC substrates up to 110 GHz

   1. Talai, Armin
   2. Steinhäußer, Frank
   3. Bittner, Achim
   4. Schmid, Ulrich
   5. Weigel, Robert
   6. Schwanke, Dieter
   7. Rittweg, Thomas

   2016 - TUHH Open Research
2. Environmental evaluation of LTCC flip-chip and surface mount technology for satellite applications

   1. Baras, Torben
   2. Molke, Alexander
   3. Schwarz, Andreas
   4. Reppe, Günter
   5. Pohlner, Jürgen
   6. Quahs, Dany
   7. Schwanke, Dieter

   2008 - TUHH Open Research
3. Environmental Evaluation of LTCC Surface Mount Technology for Satellite Applications

   1. Baras, Torben
   2. Molke, Alexander
   3. Schwarz, Andreas
   4. Reppe, Günter
   5. Pohlner, Jürgen
   6. Quahs, Dany
   7. Schwanke, Dieter

   2008 - TUHH Open Research
4. Comparison of high resolution patterning technologies for LTCC microwave circuits

   1. Müller, Jens
   2. Perrone, Rubén Ariel
   3. Drüe, Karl-Heinz
   4. Stephan, Ralf
   5. Trabert, Johannes
   6. Hein, Matthias
   7. Schwanke, Dieter

   2007 - TUHH Open Research
5. Comparison of high-resolution patterning technologies for LTCC microwave circuits

   1. Müller, Jens
   2. Perrone, Rubén Ariel
   3. Drüe, Karl-Heinz
   4. Stephan, Ralf
   5. Trabert, Johannes F.
   6. Hein, Matthias
   7. Schwanke, Dieter

   2007 - TUHH Open Research
6. Technology benchmarking of high resolution structures on LTCC for microwave circuits

   1. Müller, Jens
   2. Perrone, Rubén Ariel
   3. Thust, Heiko
   4. Drüe, Karl-Heinz
   5. Kutscher, C.
   6. Stephan, Ralf
   7. Trabert, Johannes

   2006 - TUHH Open Research