Autor/in Beyer, S. Hansen, W. 1 Heitmann, D. 1 Heyn, Ch. Klein, C. Kramp, S. alle zeigenListe einklappen
Characterization of in situ etched and molecular beam epitaxy regrown GaAs interfaces using capacitance-voltage measurements, far infrared spectroscopy, and magnetotransport measurements Klein, C. Kramp, S. Beyer, S. Heyn, Ch. Hansen, W. Heitmann, D. 2000 - Forschungsinformationssystem der UHH
